A. L. Shluger: search on Z-Library

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1

[IEEE 2014 IEEE International Electron Devices Meeting (IEDM) - San Francisco, CA, USA (2014.12.15-2014.12.17)] 2014 IEEE International Electron Devices Meeting - On the microscopic structure of hole traps in pMOSFETs

Grasser, T., Goes, W., Wimmer, Y., Schanovsky, F., Rzepa, G., Waltl, M., Rott, K., Reisinger, H., Afanas'ev, V.V., Stesmans, A., El-Sayed, A.-M., Shluger, A.L.

Year:

2014

Language:

english

File:

PDF, 1.74 MB

english, 2014

2

Recent Trends in Surface Characterization and Chemistry with High-Resolution Scanning Force Methods

Clemens Barth, Adam S. Foster, Claude R. Henry, Alexander L. Shluger

Journal:

Advanced Materials

Year:

2011

Language:

english

File:

PDF, 2.18 MB

english, 2011

3

The roles of charged and neutral oxidising species in silicon oxidation from ab initio calculations

M.A Szymanski, A.M Stoneham, A Shluger

Journal:

Microelectronics Reliability

Year:

2000

Language:

english

File:

PDF, 163 KB

english, 2000

4

Structure and properties of defects in amorphous silica: new insights from embedded cluster calculations

Sushko, Peter V, Mukhopadhyay, Sanghamitra, Mysovsky, Andrey S, Sulimov, Vladimir B, Taga, Adrian, Shluger, Alexander L

Journal:

Journal of Physics Condensed Matter

Year:

2005

Language:

english

File:

PDF, 716 KB

english, 2005

5

Modelling components of future molecular devices

Trevethan, Thomas, Shluger, Alexander, Kantorovich, Lev

Journal:

Journal of Physics Condensed Matter

Year:

2010

Language:

english

File:

PDF, 1.16 MB

english, 2010

6

Vacancy and interstitial defects in hafnia

Foster, A., Lopez Gejo, F., Shluger, A., Nieminen, R.

Journal:

Physical Review B

Year:

2002

Language:

english

File:

PDF, 837 KB

english, 2002

7

Grain boundary-driven leakage path formation in HfO2 dielectrics

G. Bersuker, J. Yum, L. Vandelli, A. Padovani, L. Larcher, V. Iglesias, M. Porti, M. Nafría, K. McKenna, A. Shluger, P. Kirsch, R. Jammy

Journal:

Solid-State Electronics

Year:

2011

Language:

english

File:

PDF, 1.16 MB

english, 2011

8

Quantitative modelling in scanning probe microscopy

A.S. Foster, W.A. Hofer, A.L. Shluger

Journal:

Current Opinion in Solid State & Materials Science

Year:

2001

Language:

english

File:

PDF, 305 KB

english, 2001

9

Metal oxide resistive memory switching mechanism based on conductive filament properties

Bersuker, G., Gilmer, D. C., Veksler, D., Kirsch, P., Vandelli, L., Padovani, A., Larcher, L., McKenna, K., Shluger, A., Iglesias, V., Porti, M., Nafria, M.

Journal:

Journal of Applied Physics

Year:

2011

Language:

english

File:

PDF, 3.53 MB

english, 2011

10

Atomic and ionic processes of silicon oxidation

Stoneham, A. Marshall, Szymanski, Marek A., Shluger, Alexander L.

Journal:

Physical Review B

Year:

2001

Language:

english

File:

PDF, 113 KB

english, 2001

11

Nature of intrinsic and extrinsic electron trapping in SiO

El-Sayed, Al-Moatasem, Watkins, Matthew B., Afanas'ev, Valery V., Shluger, Alexander L.

Journal:

Physical Review B

Year:

2014

Language:

english

File:

PDF, 1.16 MB

english, 2014

12

Investigation of transparent magnetic material formed by selective oxidation of a metallic glass

Louzguine-Luzgin, D.V., Hitosugi, T., Chen, N., Ketov, S.V., Shluger, A., Zadorozhnyy, V. Yu., Caron, A., Gonzales, S., Qin, C.L., Inoue, A.

Journal:

Thin Solid Films

Year:

2013

Language:

english

File:

PDF, 1.17 MB

english, 2013

13

[IEEE ESSDERC 2010 - 40th European Solid State Device Research Conference - Sevilla, Spain (2010.09.14-2010.09.16)] 2010 Proceedings of the European Solid State Device Research Conference - Grain boundary-driven leakage path formation in HfO2 dielectrics

Bersuker, G., Yum, J., Iglesias, V., Porti, M., Nafria, M., McKenna, K., Shluger, A., Kirsch, P., Jammy, R.

Year:

2010

Language:

english

File:

PDF, 560 KB

english, 2010

14

by impurities

Stefanovich, E. V., Shluger, A. L., Catlow, C. R. A.

Journal:

Physical Review B

Year:

1994

Language:

english

File:

PDF, 883 KB

english, 1994

15

Theories of scanning probe microscopes at the atomic scale

Hofer, Werner A., Foster, Adam S., Shluger, Alexander L.

Journal:

Review of Modern Physics

Year:

2003

Language:

english

File:

PDF, 3.10 MB

english, 2003

16

Model of noncontact scanning force microscopy on ionic surfaces

Livshits, Alexander I., Shluger, Alexander L., Rohl, Andrew L., Foster, Adam S.

Journal:

Physical Review B

Year:

1999

Language:

english

File:

PDF, 5.72 MB

english, 1999

17

Laser-induced reactions in crystals: Femtosecond pump-probe spectroscopy and ab initio calculations of self-trapped excitons and holes in KBr

Shluger, Alexander L., Tanimura, Katsumi

Journal:

Physical Review B

Year:

2000

Language:

english

File:

PDF, 289 KB

english, 2000

18

Optical transitions of the H centers in alkali halides

Shluger, A. L., Puchin, V. E., Suzuki, T., Tanimura, K., Itoh, N.

Journal:

Physical Review B

Year:

1995

Language:

english

File:

PDF, 598 KB

english, 1995

19

clusters ( n =1–48) at the (100) MgO surface

Shluger, Alexander L., Rohl, Andrew L., Gay, David H.

Journal:

Physical Review B

Year:

1995

Language:

english

File:

PDF, 807 KB

english, 1995

20

Model of self-trapped excitons in alkali halides

Puchin, V. E., Shluger, A. L., Tanimura, K., Itoh, N.

Journal:

Physical Review B

Year:

1993

Language:

english

File:

PDF, 786 KB

english, 1993

21

Theoretical and experimental investigation of force imaging at the atomic scale on alkali halide crystals

Shluger, A. L., Wilson, R. Mark, Williams, R. T.

Journal:

Physical Review B

Year:

1994

Language:

english

File:

PDF, 1.95 MB

english, 1994

22

Model of scanning force microscopy on ionic surfaces

Shluger, Alexander L., Rohl, Andrew L., Williams, Richard T., Wilson, R. Mark

Journal:

Physical Review B

Year:

1995

Language:

english

File:

PDF, 929 KB

english, 1995

23

Theoretical studies of atomic emission and defect formation by electronic excitation at the (100) surface of NaCl

Puchin, V. E., Shluger, A. L., Itoh, N.

Journal:

Physical Review B

Year:

1993

Language:

english

File:

PDF, 380 KB

english, 1993

24

Theoretical study of Na-atom emission from NaCl (100) surfaces

Puchin, Vladimir, Shluger, Alexander, Nakai, Yasuo, Itoh, Noriaki

Journal:

Physical Review B

Year:

1994

Language:

english

File:

PDF, 470 KB

english, 1994

25

Modeling of the structure and properties of oxygen vacancies in amorphous silica

Mukhopadhyay, Sanghamitra, Sushko, Peter V., Stoneham, A. Marshall, Shluger, Alexander L.

Journal:

Physical Review B

Year:

2004

Language:

english

File:

PDF, 402 KB

english, 2004

26

Electron correlation in the self-trapped hole and exciton in the NaCl crystal

Puchin, V. E., Shluger, A. L., Itoh, N.

Journal:

Physical Review B

Year:

1995

Language:

english

File:

PDF, 424 KB

english, 1995

27

Theoretical modeling of charge trapping in crystalline and amorphous Al 2 O 3

Dicks, Oliver A, Shluger, Alexander L

Journal:

Journal of Physics Condensed Matter

Year:

2017

Language:

english

File:

PDF, 1023 KB

english, 2017

28

Recombination defects at the 4H-SiC/SiO 2 interface investigated with electrically detected magnetic resonance and ab initio calculations

Cottom, J., Gruber, G., Pobegen, G., Aichinger, T., Shluger, A. L.

Journal:

Journal of Applied Physics

Year:

2018

Language:

english

File:

PDF, 5.21 MB

english, 2018

29

Effect of electric field on migration of defects in oxides: Vacancies and interstitials in bulk MgO

El-Sayed, Al-Moatasem, Watkins, Matthew B., Grasser, Tibor, Shluger, Alexander L.

Journal:

Physical Review B

Year:

2018

Language:

english

File:

PDF, 1.89 MB

english, 2018

30

[IEEE 2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Singapore (2018.7.16-2018.7.19)] 2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Theoretical Study of Ag Interactions in Amorphous Silica RRAM Devices

Patel, K., Cottom, J., Bosman, M., Kenyon, A. J., Shluger, A. L.

Year:

2018

Language:

english

File:

PDF, 673 KB

english, 2018

31

An oxygen vacancy mediated Ag reduction and nucleation mechanism in SiO2 RRAM devices

Patel, K., Cottom, J., Bosman, M., Kenyon, A.J., Shluger, A.L.

Journal:

Microelectronics Reliability

Year:

2019

Language:

english

File:

PDF, 1.87 MB

english, 2019

32

First Principles Study of the Influence of the Local Steric Environment on the Incorporation and Migration of NO in a-SiO2

Mistry, Manesh V., Cottom, Jonathon, Patel, K., El-Sayed, A.M., Pobegen, Gregor, Aichinger, Thomas, Shluger, Alexander L.

Journal:

Materials Science Forum

Year:

2019

File:

PDF, 2.07 MB

2019

33

Evidence for an Abrupt Transition between SiO2 and SiC from EELS and Ab Initio Modelling

Cottom, Jonathon, Mistry, Manesh V., Gruber, Gernot, Pobegen, Gregor, Aichinger, Thomas, Shluger, Alexander L.

Journal:

Materials Science Forum

Year:

2019

File:

PDF, 1.04 MB

2019

34

Intramolecular Dipole Coupling and Depolarization in Self-Assembled Monolayers

Maria L. Sushko, Alexander L. Shluger

Journal:

Advanced Functional Materials

Year:

2008

Language:

english

File:

PDF, 309 KB

english, 2008

35

Physics of Nanomechanical Biosensing on Cantilever Arrays

Maria L. Sushko, John H. Harding, Alexander L. Shluger, Rachel A. McKendry, Moyu Watari

Journal:

Advanced Materials

Year:

2008

Language:

english

File:

PDF, 413 KB

english, 2008

36

Rough and Fine Tuning of Metal Work Function via Chemisorbed Self-Assembled Monolayers

Maria L. Sushko, Alexander L. Shluger

Journal:

Advanced Materials

Year:

2009

Language:

english

File:

PDF, 206 KB

english, 2009

37

QM/MM method for metal–organic interfaces

Maria L. Sushko, Peter V. Sushko, Igor V. Abarenkov, Alexander L. Shluger

Journal:

Journal of Computational Chemistry

Year:

2010

Language:

english

File:

PDF, 936 KB

english, 2010

38

Femtosecond spectroscopy of self-trapping processes of holes and excitons in alkali halides

S. Iwai, T. Tokizaki, A. Nakamura, T. Shibata, K. Tanimura, A. Shluger, N. Itoh

Journal:

Journal of Luminescence

Year:

1994

Language:

english

File:

PDF, 260 KB

english, 1994

39

On the nonequivalency of Si-O bonds in silicon dioxide

Alexander Shluger

Journal:

Journal of Physics and Chemistry of Solids

Year:

1986

Language:

english

File:

PDF, 658 KB

english, 1986

40

Formation of self-trapped holes under optical excitation of impurity centres in LiF crystals

A. Shluger, S. Mysovsky, A. Nepomnyaschikh

Journal:

Journal of Physics and Chemistry of Solids

Year:

1988

Language:

english

File:

PDF, 276 KB

english, 1988

41

Quantum-chemical simulation of Frenkel pairs separation in a LiF crystal

E. Kotomin, A. Shluger

Journal:

Solid State Communications

Year:

1981

Language:

english

File:

PDF, 296 KB

english, 1981

42

Calculation of energies of radiative tunneling transitions between defects in alkali halides

A. Shluger, E. Kotomin, L. Kantorovich

Journal:

Solid State Communications

Year:

1982

Language:

english

File:

PDF, 379 KB

english, 1982

43

Electronic structure of thallous centres and Tl+ - Vk recombination in KCl crystal

E. Kotomin, A. Shluger, I. Tāle

Journal:

Solid State Communications

Year:

1983

Language:

english

File:

PDF, 438 KB

english, 1983

44

Intrinsic and defect-assisted trapping of electrons and holes in HfO2: an ab initio study

D. Muñoz Ramo, J.L. Gavartin, A.L. Shluger, G. Bersuker

Journal:

Microelectronic Engineering

Year:

2007

Language:

english

File:

PDF, 454 KB

english, 2007

45

Electronic structure of insulator-confined ultra-thin Si channels

P.V. Sushko, A.L. Shluger

Journal:

Microelectronic Engineering

Year:

2007

Language:

english

File:

PDF, 1.24 MB

english, 2007

46

DLVO theory for like-charged polyelectrolyte and surface interactions

Maria L. Sushko, A.L. Shluger

Journal:

Materials Science and Engineering: C

Year:

2007

Language:

english

File:

PDF, 362 KB

english, 2007

47

The effect of van der Waals interactions on the properties of intrinsic defects in graphite

Gilberto Teobaldi, Hiromasa Ohnishi, Katsumi Tanimura, Alexander L. Shluger

Journal:

Year:

2010

Language:

english

File:

PDF, 2.20 MB

english, 2010

48

Simulation of coherent control of hydroxyl formed due to HCl adsorption on MgO(0 0 1)

Andreas Markmann, Jacob L. Gavartin, Alexander L. Shluger

Journal:

Chemical Physics

Year:

2006

Language:

english

File:

PDF, 501 KB

english, 2006

49

Oxygen vacancies in amorphous silica: structure and distribution of properties

P.V. Sushko, S. Mukhopadhyay, A.M. Stoneham, A.L. Shluger

Journal:

Microelectronic Engineering

Year:

2005

Language:

english

File:

PDF, 231 KB

english, 2005

50

Ab initio modeling of structure and defects at the HfO2/Si interface

J.L. Gavartin, L. Fonseca, G. Bersuker, A.L Shluger

Journal:

Microelectronic Engineering

Year:

2005

Language:

english

File:

PDF, 173 KB

english, 2005

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